Altmetric Badges Can Now Be Found on the IEEE Xplore Digital Library

The Institute of Electrical and Electronics Engineers (IEEE) is the largest, global professional organisation dedicated to advancing technology for the benefit of humanity. Today, IEEE adds Altmetric badges to their IEEE Xplore® Digital Library, home to over 3.8 million scholarly documents, to enable authors and editors to track online attention for research articles.

The integration of Altmetric badges will allow authors, researchers, and other platform visitors to easily see a collated record of the online shares and discussion relating to an individual article from a variety of sources. These sources include: news and social media, public policy documents, post-publication review forums, online reference managers and Wikipedia.

Euan Adie, Founder of Altmetric says:

“In adding the Altmetric data to their articles the IEEE are offering users a huge amount of additional context for their content. Readers will be able to see how an article has been received amongst a broader audience, and authors will have the advantage of being able to track the online comments and discussion of their work as soon as it’s published.”

Reynold Guida, Director of Product Management at IEEE adds:

“Integrating the Altmetric data means we can now showcase online activity around our publications and provide authors, editors, and others with evidence of the broader impact of their work to research funders, employers, and their peers.”

If you wish to find out more, you can read the official press release here.